Cita APA (7th ed.)

Bushnell, M. L., & Agrawal, V. D. (2000). Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer.

Cita Chicago (17th ed.)

Bushnell, Michael L., i Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Boston: Springer, 2000.

Cita MLA (8th ed.)

Bushnell, Michael L., i Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Springer, 2000.