APA-viite (7. p.)

Bushnell, M. L., & Agrawal, V. D. (2000). Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer.

Chicago-viite (17. p.)

Bushnell, Michael L., ja Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Boston: Springer, 2000.

MLA-viite (8. p.)

Bushnell, Michael L., ja Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Springer, 2000.