Bushnell, M. L., & Agrawal, V. D. (2000). Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रBushnell, Michael L., और Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Boston: Springer, 2000.
एमएलए (8वां संस्करण) प्रशस्ति पत्रBushnell, Michael L., और Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Springer, 2000.
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