Bushnell, M. L., & Agrawal, V. D. (2000). Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer.
Chicagoスタイル(17版)引用形式Bushnell, Michael L., , Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Boston: Springer, 2000.
MLA(8版)引用形式Bushnell, Michael L., , Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Springer, 2000.
警告: この引用は必ずしも正確ではありません.