APA引文

Bushnell, M. L., & Agrawal, V. D. (2000). Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer.

Chicago Style (17th ed.) Citation

Bushnell, Michael L., and Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Boston: Springer, 2000.

MLA引文

Bushnell, Michael L., and Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Springer, 2000.