Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Wedi'i Gadw mewn:
Prif Awdur: | Bushnell, Michael L. (Michael Lee), 1950- (Awdur) |
---|---|
Awduron Eraill: | Agrawal, Vishwani D., 1943- |
Fformat: | Llyfr |
Iaith: | English |
Cyhoeddwyd: |
Boston
Springer
2000.
|
Cyfres: | Frontiers in electronic testing;
17 |
Pynciau: | |
Mynediad Ar-lein: | Click here to view the full text content |
Tagiau: |
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