Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awdur:	Bushnell, Michael L. (Michael Lee), 1950- (Awdur)
Awduron Eraill:	Agrawal, Vishwani D., 1943-
Fformat:	Llyfr
Iaith:	English
Cyhoeddwyd:	Boston Springer 2000.
Cyfres:	Frontiers in electronic testing; 17
Pynciau:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Mynediad Ar-lein:	Click here to view the full text content
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

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