Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Εμφάνιση άλλων εκδόσεων (3)

Αποθηκεύτηκε σε:

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Bushnell, Michael L. (Michael Lee), 1950- (Συγγραφέας)
Άλλοι συγγραφείς:	Agrawal, Vishwani D., 1943-
Μορφή:	Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston Springer 2000.
Σειρά:	Frontiers in electronic testing; 17
Θέματα:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Διαθέσιμο Online:	Click here to view the full text content
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