Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Détails bibliographiques
Auteur principal:	Bushnell, Michael L. (Michael Lee), 1950- (Auteur)
Autres auteurs:	Agrawal, Vishwani D., 1943-
Format:	Livre
Langue:	English
Publié:	Boston Springer 2000.
Collection:	Frontiers in electronic testing; 17
Sujets:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Accès en ligne:	Click here to view the full text content
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