Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Sonraí bibleagrafaíochta
Príomhchruthaitheoir:	Bushnell, Michael L. (Michael Lee), 1950- (Údar)
Rannpháirtithe:	Agrawal, Vishwani D., 1943-
Formáid:	LEABHAR
Teanga:	English
Foilsithe / Cruthaithe:	Boston Springer 2000.
Sraith:	Frontiers in electronic testing; 17
Ábhair:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Rochtain ar líne:	Click here to view the full text content
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

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