Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Bibliografske podrobnosti
Glavni avtor:	Bushnell, Michael L. (Michael Lee), 1950- (Author)
Drugi avtorji:	Agrawal, Vishwani D., 1943-
Format:	Knjiga
Jezik:	English
Izdano:	Boston Springer 2000.
Serija:	Frontiers in electronic testing; 17
Teme:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Online dostop:	Click here to view the full text content
Oznake:	Označite Brez oznak, prvi označite!

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