Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Detaylı Bibliyografya
Yazar:	Bushnell, Michael L. (Michael Lee), 1950- (Yazar)
Diğer Yazarlar:	Agrawal, Vishwani D., 1943-
Materyal Türü:	Kitap
Dil:	English
Baskı/Yayın Bilgisi:	Boston Springer 2000.
Seri Bilgileri:	Frontiers in electronic testing; 17
Konular:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Online Erişim:	Click here to view the full text content
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

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