Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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书目详细资料
主要作者:	Bushnell, Michael L. (Michael Lee), 1950- (Author)
其他作者:	Agrawal, Vishwani D., 1943-
格式:	图书
语言:	English
出版:	Boston Springer 2000.
丛编:	Frontiers in electronic testing; 17
主题:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
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