Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Bibliografske podrobnosti
Glavni avtor: Bushnell, Michael L. (Michael Lee), 1950- (Author)
Drugi avtorji: Agrawal, Vishwani D., 1943-
Format: Knjiga
Jezik:English
Izdano: Boston Springer 2000.
Serija:Frontiers in electronic testing; 17
Teme:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
Online dostop:Click here to view the full text content
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