Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awdur: Bushnell, Michael L. (Michael Lee), 1950- (Awdur)
Awduron Eraill: Agrawal, Vishwani D., 1943-
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: Boston Springer 2000.
Cyfres:Frontiers in electronic testing; 17
Pynciau:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
Mynediad Ar-lein:Click here to view the full text content
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Search Result 1
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
gan Bushnell, Michael L.
Cyhoeddwyd 2000
Llyfr
Ychwanegu at ffefrynnau
Wedi'i Gadw mewn:
Search Result 2
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
gan Bushnell, Michael L.
Cyhoeddwyd 2000
Llyfr
Ychwanegu at ffefrynnau
Wedi'i Gadw mewn:
Search Result 3
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
gan Bushnell, Michael L.
Cyhoeddwyd 2000
Llyfr
Ychwanegu at ffefrynnau
Wedi'i Gadw mewn:
Show all versions (4)

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