Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Taispeáin leaganacha eile (3)
Sábháilte in:
Sonraí bibleagrafaíochta
Príomhchruthaitheoir: Bushnell, Michael L. (Michael Lee), 1950- (Údar)
Rannpháirtithe: Agrawal, Vishwani D., 1943-
Formáid: LEABHAR
Teanga:English
Foilsithe / Cruthaithe: Boston Springer 2000.
Sraith:Frontiers in electronic testing; 17
Ábhair:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
de réir Bushnell, Michael L.
Foilsithe / Cruthaithe 2000
LEABHAR
Cuir le mo chuid Ceanán
Sábháilte in:
Search Result 2
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
de réir Bushnell, Michael L.
Foilsithe / Cruthaithe 2000
LEABHAR
Cuir le mo chuid Ceanán
Sábháilte in:
Search Result 3
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
de réir Bushnell, Michael L.
Foilsithe / Cruthaithe 2000
LEABHAR
Cuir le mo chuid Ceanán
Sábháilte in:
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