Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Bibliografski detalji
Glavni autor: Bushnell, Michael L. (Michael Lee), 1950- (Autor)
Daljnji autori: Agrawal, Vishwani D., 1943-
Format: Knjiga
Jezik:English
Izdano: Boston Springer 2000.
Serija:Frontiers in electronic testing; 17
Teme:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
od Bushnell, Michael L.
Izdano 2000
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
od Bushnell, Michael L.
Izdano 2000
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
od Bushnell, Michael L.
Izdano 2000
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