Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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书目详细资料
主要作者: Bushnell, Michael L. (Michael Lee), 1950- (Author)
其他作者: Agrawal, Vishwani D., 1943-
格式: 图书
语言:English
出版: Boston Springer 2000.
丛编:Frontiers in electronic testing; 17
主题:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
由 Bushnell, Michael L.
出版 2000
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
由 Bushnell, Michael L.
出版 2000
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
由 Bushnell, Michael L.
出版 2000
图书
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