Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Bibliographic Details
Main Author: Bushnell, Michael L. (Michael Lee), 1950- (Author)
Other Authors: Agrawal, Vishwani D., 1943-
Format: Book
Language:English
Published: Boston Springer 2000.
Series:Frontiers in electronic testing; 17
Subjects:
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