Semiconductor measurements and instrumentation /

Saved in:
Bibliographic Details
Main Author: Runyan, W. R. (Author)
Other Authors: Shaffner, T. J.
Format: Book
Language:English
Published: New York McGraw-Hill ©1998
Edition:Second edition
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:x, 454 pages: illustrations 24 cm.
ISBN:0070576971