Hurst, S. L. VLSI testing: Digital and mixed analogue/digital techniques. The Institution of Electrical Engineers.
Style de citation Chicago (17e éd.)Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. London: The Institution of Electrical Engineers.
Style de citation MLA (8e éd.)Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. The Institution of Electrical Engineers.
Attention : ces citations peuvent ne pas être correctes à 100%.