APA (7th ed.) Citation

International Workshop On Beam Injection Assessment Of Microstructures In Semiconductors (6th : 2000 : Fukuoka, Japan), Sekiguchi, T., & Tomokage, H. (2001). Beam injection assessment of microstructures in semiconductors: BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000. Scitec Publications.

Chicago Style (17th ed.) Citation

International Workshop On Beam Injection Assessment Of Microstructures In Semiconductors (6th : 2000 : Fukuoka, Japan), Takashi Sekiguchi, and Hajime Tomokage. Beam Injection Assessment of Microstructures in Semiconductors: BIAMS 2000 : Proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors Held in Fukuoka, Japan, November 12-16, 2000. Uetikon-Zuerich, Switzerland: Scitec Publications, 2001.

MLA (8th ed.) Citation

International Workshop On Beam Injection Assessment Of Microstructures In Semiconductors (6th : 2000 : Fukuoka, Japan), et al. Beam Injection Assessment of Microstructures in Semiconductors: BIAMS 2000 : Proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors Held in Fukuoka, Japan, November 12-16, 2000. Scitec Publications, 2001.