Reliability & failure analysis (EMT 361) /

Reliability & failure analysis (EMT 361) /

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Bibliographic Details
Other Authors: Zul Azhar Zahid Jamal
Format: Book
Language:English
Published: Kangar, Perlis UniMAP c2007
Subjects:
Semiconductors > Failures.
Semiconductors > Reliability.
Semiconductors > Testing.
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Description
Item Description:Laboratory Module
Physical Description:32 pages: illustrations; 29 cm.
ISBN:X080000000089

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