Schroder, D. K. (2006). Semiconductor material and device characterization (Third edition.). Wiley-Interscience.
Chicago Style (17th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. Third edition. Hoboken, N.J: Wiley-Interscience, 2006.
MLA (8th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. Third edition. Wiley-Interscience, 2006.
Warning: These citations may not always be 100% accurate.