Semiconductor material and device characterization /
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Main Author: | |
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Format: | Thesis Book |
Language: | English |
Published: |
Hoboken, N.J.
Wiley-Interscience
c2006.
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Edition: | Third edition |
Subjects: | |
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Item Description: | "Wiley-Interscience." |
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Physical Description: | xv, 779 pages: illustrations; 24 cm. |
Bibliography: | Includes bibliographical references and index. |
ISBN: | 0471739065 (hc) 9780471739067 |