APA aipamena

Goodhew, P. J., Beanland, R., & Humphreys, J. (2001). Electron microscopy and analysis (3rd ed.). Taylor & Francis.

Chicago Style aipamena

Goodhew, Peter J., Richard Beanland, and John Humphreys. Electron Microscopy and Analysis. 3rd ed. London: Taylor & Francis, 2001.

MLA aipamena

Goodhew, Peter J., et al. Electron Microscopy and Analysis. 3rd ed. Taylor & Francis, 2001.