Safinah Nor Bt Jusoh. Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM).
Citace podle Chicago (17th ed.)Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).
Citace podle MLA (8th ed.)Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).
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