Παραπομπή σε μορφή APA (7η εκδ.)

Safinah Nor Bt Jusoh. Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM).

Παραπομπή σε μορφή Chicago (17η εκδ.)

Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).

Παραπομπή σε μορφή MLA (8th εκδ.)

Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).