Safinah Nor Bt Jusoh. Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM).
Chicagoスタイル(17版)引用形式Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).
MLA(8版)引用形式Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).
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