APA (7e ed.) Bronvermelding

Safinah Nor Bt Jusoh. Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM).

Chicago (17e ed.) Bronvermelding

Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).

MLA (8e ed.) Bronvermelding

Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).