Safinah Nor Bt Jusoh. Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM).
芝加哥风格引文Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).
MLA引文Safinah Nor Bt Jusoh. Surface and Grain Size Characterization of Gallium and Tantalum Doped Ba0.5Sr0.5TiO3 Thin Film Using Atomic Force Microscope (AFM).
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