Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)
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| Format: | Book |
| Language: | English |
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| Item Description: | Laporan Projek Tahun Akhir Sidang Akademik 2005/2006 PPK Mikroelektonik |
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| Physical Description: | xi, 63pages illustrations 30cm |