Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)

Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)

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Dades bibliogràfiques
Autor principal:	Safinah Nor Bt Jusoh (Autor)
Format:	Llibre
Idioma:	English
Matèries:	Atomic force microscopy
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