Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)
Sábháilte in:
Príomhchruthaitheoir: | Safinah Nor Bt Jusoh (Údar) |
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Formáid: | LEABHAR |
Teanga: | English |
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