Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures...
Sábháilte in:
| Príomhchruthaitheoir: | |
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| Formáid: | Leictreonach Bogearraí Bunachar sonraí |
| Teanga: | English |
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| Clibeanna: |
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| Achoimre: | Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures. The scope of this project is to analyze the purity of carbon with varies of acceleration voltages. |
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| Cur síos ar an mír: | Final Year Project |
| Cur síos fisiciúil: | 1 CD-ROM 4 3/4 in. |