Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures...
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| Định dạng: | Điện tử Phần mềm Cơ sở dữ liệu |
| Ngôn ngữ: | English |
| Những chủ đề: | |
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| Tóm tắt: | Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures. The scope of this project is to analyze the purity of carbon with varies of acceleration voltages. |
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| Mô tả sách: | Final Year Project |
| Mô tả vật lý: | 1 CD-ROM 4 3/4 in. |