Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry

Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry

Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures...

Fuld beskrivelse

Saved in:

Bibliografiske detaljer
Hovedforfatter:	Nur Liana Kamal (Author)
Format:	Electronisk Software Database
Sprog:	English
Fag:	Microelectronics.
Tags:	Tilføj Tag Ingen Tags, Vær først til at tagge denne postø!

Lignende værker

Study of deposition time influence the conical structure during electron beam induced deposition (EBID)
af: Mohamad Shahrizal Md Ilias

The influence on the accelerating voltages on the growth of the square structure during electron beam induced deposition (EBID) method
af: Muhammad Afiq Abdul Aziz

Analysis of square shaped microstructure based electron bean induced deposition
af: Siti Fatimah Abdul Rahman

Study of acceleratin voltage influence the conical structure during electron beam induced depasition (EBID)
af: Muhammad Afif Abdul Rahman

Scanning electron microscopy /
Udgivet: (2015)

Electron beams and microwave vacuum electronics /
af: Tsimring, Shulim E., 1924-
Udgivet: (2007)

Electron beams and microwave vacuum electronics /
af: Tsimring, Shulim E.
Udgivet: (2007)

Optimization of nitride deposition process using Taguchi method
af: Low, Zen Shiang

Electron beams and microwave vacuum electronics
af: Tsimring, Shulim E.
Udgivet: (2007)

Electron beams and microwave vacuum electronics
af: Tsimring, Shulim E.
Udgivet: (2007)

Electron beams and microwave vacuum electronics /
af: Tsimring, Shulim E.
Udgivet: (2007)

Scanning Auger electron microscopy /
Udgivet: (2006)

Assigning structures to ions in mass spectrometry /
af: Holmes, John L. (John Leonard), 1931-
Udgivet: (2007)

Scanning transmission electron microscopy : imaging and analysis/
Udgivet: (2011)

Intense electron and ion beams
af: Molokovsky, Sergey Ivanovich
Udgivet: (2005)

Simulation of ion implantation using Monte Carlo method for investigation on ion trajectories
af: Zainab Ramli

Key concepts of scanning electron microscopy /
Udgivet: (2015)

Practical aspects of ion trap mass spectrometry /
Udgivet: (1995)

Practical aspects of ion trap mass spectrometry /
Udgivet: (1995)

Electron microprobe analysis and scanning electron microscopy in geology /
af: Reed, S. J. B.
Udgivet: (1996)

MEMS cantilever beam monitor
af: Muhammad Asyraf Ahmad Zulkifli

Imaging mass spectrometry : protocols for mass microscopy /
Udgivet: (2010)

Imaging mass spectrometry protocols for mass microscopy /
Udgivet: (2010)

Principles and techniques of scanning electron microscopy : biological applications /
Udgivet: (1974)

Ion mobility spectrometry /
af: Eiceman, Gary Alan
Udgivet: (2014)

New horizons of applied scanning electron microscopy
af: Shimizu, Kenichi
Udgivet: (2010)

Biological Low-Voltage Scanning Electron Microscopy
Udgivet: (2008)

New horizons of applied scanning electron microscopy
af: Shimizu, Kenichi
Udgivet: (2010)

Electronic devices and circuits /
af: Salivahanan, S.
Udgivet: (1998)

Mass spectrometry /
af: Davis, Reg
Udgivet: (1987)

Handbook of plasma immersion ion implantation and deposition
Udgivet: (2000)

Handbook of plasma immersion ion implantation and deposition /

Handbook of plasma immersion ion implantation and deposition
Udgivet: (2000)

Electronic devices & circuits - II /
af: Godse, Atul P.
Udgivet: (2008)

Scanning electrochemical microscopy /
Udgivet: (2012)

Scanning electrochemical microscopy /
Udgivet: (2001)

Scanning electrochemical microscopy /
Udgivet: (2012)

Scanning electrochemical microscopy
Udgivet: (2012)

Scanning electrochemical microscopy
Udgivet: (2001)

Scanning probe microscopy /