Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures...
Sábháilte in:
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| Formáid: | Leictreonach Bogearraí Bunachar sonraí |
| Teanga: | English |
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| Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
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