Study of deposition time influence the conical structure during electron beam induced deposition (EBID)
This final year project is about studying parameter (deposition time) influence during electron beam induced deposition (EBID) in scanning electron microscopy (SEM). EBID is a versatile micro and nanofabrication technique based on electron-induced dissociation of carrying gas molecules adsorbed on a...
Saved in:
| 主要作者: | |
|---|---|
| 格式: | 电子 软件 数据库 |
| 语言: | English |
| 主题: | |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: