Study of deposition time influence the conical structure during electron beam induced deposition (EBID)
This final year project is about studying parameter (deposition time) influence during electron beam induced deposition (EBID) in scanning electron microscopy (SEM). EBID is a versatile micro and nanofabrication technique based on electron-induced dissociation of carrying gas molecules adsorbed on a...
Gorde:
Egile nagusia: | Mohamad Shahrizal Md Ilias (Egilea) |
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Formatua: | Baliabide elektronikoa Software Datu-basea |
Hizkuntza: | English |
Gaiak: | |
Etiketak: |
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Antzeko izenburuak
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Study of acceleratin voltage influence the conical structure during electron beam induced depasition (EBID)
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The influence on the accelerating voltages on the growth of the square structure during electron beam induced deposition (EBID) method
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Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
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Analysis of square shaped microstructure based electron bean induced deposition
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Optimization of nitride deposition process using Taguchi method
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