Study of deposition time influence the conical structure during electron beam induced deposition (EBID)

Study of deposition time influence the conical structure during electron beam induced deposition (EBID)

This final year project is about studying parameter (deposition time) influence during electron beam induced deposition (EBID) in scanning electron microscopy (SEM). EBID is a versatile micro and nanofabrication technique based on electron-induced dissociation of carrying gas molecules adsorbed on a...

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Sonraí bibleagrafaíochta
Príomhchruthaitheoir:	Mohamad Shahrizal Md Ilias (Údar)
Formáid:	Leictreonach Bogearraí Bunachar sonraí
Teanga:	English
Ábhair:	Microelectronics.
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

Míreanna comhchosúla

Study of acceleratin voltage influence the conical structure during electron beam induced depasition (EBID)
de réir: Muhammad Afif Abdul Rahman

The influence on the accelerating voltages on the growth of the square structure during electron beam induced deposition (EBID) method
de réir: Muhammad Afiq Abdul Aziz

Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
de réir: Nur Liana Kamal

Analysis of square shaped microstructure based electron bean induced deposition
de réir: Siti Fatimah Abdul Rahman

Optimization of nitride deposition process using Taguchi method
de réir: Low, Zen Shiang

MEMS cantilever beam monitor
de réir: Muhammad Asyraf Ahmad Zulkifli

Electron beams and microwave vacuum electronics /
de réir: Tsimring, Shulim E., 1924-
Foilsithe / Cruthaithe: (2007)

Electron beams and microwave vacuum electronics /
de réir: Tsimring, Shulim E.
Foilsithe / Cruthaithe: (2007)

Electron beams and microwave vacuum electronics
de réir: Tsimring, Shulim E.
Foilsithe / Cruthaithe: (2007)

Electron beams and microwave vacuum electronics
de réir: Tsimring, Shulim E.
Foilsithe / Cruthaithe: (2007)

Electron beams and microwave vacuum electronics /
de réir: Tsimring, Shulim E.
Foilsithe / Cruthaithe: (2007)

Micro-and opto-electronic materials and structures : physics, mechanics, design, reliability, packaging /
Foilsithe / Cruthaithe: (2007)

Simulation, fabrication and electrical characterization of p-Si capacitor design structure
de réir: Cherly, She Siew Yuet

Simulation on effect of different types of channel/ drain engineering structure on MOS device performance
de réir: Norazlina Mohd Amin

The study on the effect of varing dopant concentration and diffusion time in the design of silicon avalanche diode with minimum VBR of 120+-20%
de réir: Yip, Siew Ling

Electrical characterization of 0.13℗æm NMOS transistor with retrograde well and halo implant structure respectively
de réir: Anas Redzuan Mokhtar

Electronic devices & circuits - II /
de réir: Godse, Atul P.
Foilsithe / Cruthaithe: (2008)

Structural & electrical characterization of Ba(0.5)S(0.5)Tio3 thin films in effect annealing temperature
de réir: Ramadhan Adnan

Design of electronic compass for Qiblat determination/
de réir: Mohd Haffizul Zohri Jarir
Foilsithe / Cruthaithe: (2011)

Knowles Electronics (M) Sdn. Bhd
de réir: Mohd Shafari Mohamad Dadiri

Micro- and opto-electronic materials and structures physics, mechanics, design, reliability, packaging
Foilsithe / Cruthaithe: (2007)

Micro- and opto-electronic materials and structures physics, mechanics, design, reliability, packaging
Foilsithe / Cruthaithe: (2007)

Micro-and opto-electronic materials and structures : physics, mechanics, design, reliability, packaging /
Foilsithe / Cruthaithe: (2007)

Visual basic implementation of electronic azan reciter
de réir: Marlina Abu Bakar

Study of aspect ratio performance on silicon oxide etching using profiler meter, AFM and SEM
de réir: Nur Syuhada Md. Desa

Serial peripheral interface (SPI) (front end design)
de réir: Mohd Noorkasyfi Md Shariff

Study of the effect of different gases parameter in dry etching process on etch rate profile
de réir: Zaharah Mohamad

Characterization of intermetallic growth in gold ballbonds on aluminum metallization [electronic resource] /
de réir: Lim, Moy Fung

Study of the thickness of the silicon dioxide on wafer using dry and wet oxidation method
de réir: Mohamad Fadzli Ali

FPGA implementation of cash money register
de réir: Mohd Shafari Mohamad Dadiri

Study of semi-recessed LOCOS for quasi-nanoscale CMOS devise isolation
de réir: Mohamad Idzham Abd Sani

Develop Algorithm for Inverse Park Transformation/
de réir: Fairuz Nadzirah Mohamad Ibrahim
Foilsithe / Cruthaithe: (2011)

Heart beat sensor circuit for anti - stress chair
de réir: Farah Athirah Jamal Mohamad
Foilsithe / Cruthaithe: (2015)

Future trends in microelectronics : frontiers and innovations /
Foilsithe / Cruthaithe: (2013)

Microelectronics /
de réir: Razavi, Behzad
Foilsithe / Cruthaithe: (2015)

Android smart home for the disabled
de réir: Nor Faezah Binti Mohamad Araf
Foilsithe / Cruthaithe: (2015)

Advanced electronic packaging /
Foilsithe / Cruthaithe: (2006)

Advanced Electronic Packaging / edited by Richard K. Ulrich, William D. Brown.
Foilsithe / Cruthaithe: (2006)

Edict Electronic Sdn. Bhd.
de réir: Mohd Aliff Azam B. Mohd Suhud

Advanced electronic packaging : with emphasis on multichip modules /
Foilsithe / Cruthaithe: (1998)