Study of deposition time influence the conical structure during electron beam induced deposition (EBID)

Study of deposition time influence the conical structure during electron beam induced deposition (EBID)

This final year project is about studying parameter (deposition time) influence during electron beam induced deposition (EBID) in scanning electron microscopy (SEM). EBID is a versatile micro and nanofabrication technique based on electron-induced dissociation of carrying gas molecules adsorbed on a...

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Библиографические подробности
Главный автор:	Mohamad Shahrizal Md Ilias (Автор)
Формат:	Электронный ресурс Программное обеспечение База данных
Язык:	English
Предметы:	Microelectronics.
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

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