Study of deposition time influence the conical structure during electron beam induced deposition (EBID)
This final year project is about studying parameter (deposition time) influence during electron beam induced deposition (EBID) in scanning electron microscopy (SEM). EBID is a versatile micro and nanofabrication technique based on electron-induced dissociation of carrying gas molecules adsorbed on a...
Shranjeno v:
Glavni avtor: | Mohamad Shahrizal Md Ilias (Author) |
---|---|
Format: | Elektronski Software Database |
Jezik: | English |
Teme: | |
Oznake: |
Označite
Brez oznak, prvi označite!
|
Podobne knjige/članki
-
Study of acceleratin voltage influence the conical structure during electron beam induced depasition (EBID)
od: Muhammad Afif Abdul Rahman -
The influence on the accelerating voltages on the growth of the square structure during electron beam induced deposition (EBID) method
od: Muhammad Afiq Abdul Aziz -
Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
od: Nur Liana Kamal -
Analysis of square shaped microstructure based electron bean induced deposition
od: Siti Fatimah Abdul Rahman -
Optimization of nitride deposition process using Taguchi method
od: Low, Zen Shiang