Study of deposition time influence the conical structure during electron beam induced deposition (EBID)
This final year project is about studying parameter (deposition time) influence during electron beam induced deposition (EBID) in scanning electron microscopy (SEM). EBID is a versatile micro and nanofabrication technique based on electron-induced dissociation of carrying gas molecules adsorbed on a...
Guardat en:
Autor principal: | |
---|---|
Format: | Electrònic Software Base de dades |
Idioma: | English |
Matèries: | |
Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Sigues el primer a deixar un comentari!