Analysis of square shaped microstructure based electron bean induced deposition
The scope of this final year project is to analyze the smoothness of the surface and the growth rate of the structure influenced by the deposition times during EBID process. The deposited area will be analyzed using AFM to investigate which time is suitable as a parameter during the EBID process to...
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| Format: | Électronique Logiciel Base de données |
| Langue: | English |
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