Analysis of square shaped microstructure based electron bean induced deposition
The scope of this final year project is to analyze the smoothness of the surface and the growth rate of the structure influenced by the deposition times during EBID process. The deposited area will be analyzed using AFM to investigate which time is suitable as a parameter during the EBID process to...
Shranjeno v:
| Glavni avtor: | |
|---|---|
| Format: | Elektronski Software Database |
| Jezik: | English |
| Teme: | |
| Oznake: |
Označite
Brez oznak, prvi označite!
|
Vzdrževanje sistema
Trenutno vzdržujemo knjižnični informacijski sistem.
Informacije o zalogi so trenutno nedostopne. Opravičujemo se za nevšečnosti in vas prosimo da nas ponovno kontaktirate: