Analysis of square shaped microstructure based electron bean induced deposition
The scope of this final year project is to analyze the smoothness of the surface and the growth rate of the structure influenced by the deposition times during EBID process. The deposited area will be analyzed using AFM to investigate which time is suitable as a parameter during the EBID process to...
Saved in:
主要作者: | |
---|---|
格式: | 電子 軟件 Database |
語言: | English |
主題: | |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: