Iddq testing for CMOS VLSI /
Saved in:
Main Author: | Rajsuman, Rochit (Author) |
---|---|
Format: | Book |
Language: | English |
Published: |
Boston
Artech House
1995
|
Subjects: | |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
VLSI testing : digital and mixed analogue/digital techniques /
by: Hurst, Stanley L.
Published: (1998) -
VLSI testing : digital and mixed analogue/digital techniques /
by: Hurst, Stanley L. -
Defect-oriented testing for nano-metric CMOS VLSI circuits /
Published: (2007) -
VLSI test principles and architectures : design for testability /
Published: (2006) -
VLSI test principles and architectures design for testability
Published: (2006)