High-level test synthesis of digital VLSI circuits /

High-level test synthesis of digital VLSI circuits /

Gorde:
Xehetasun bibliografikoak
Egile nagusia: Lee, Mike Tien - Chien (Egilea)
Formatua: Liburua
Hizkuntza:English
Argitaratua: Boston Artech House c1997
Saila:The Artech House solid-state technology library
Gaiak:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Testing > Data processing.
Computer-aided design.
Digital integrated circuits > Testing > Data processing.
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Deskribapena
Deskribapen fisikoa:xi, 220 pages: illustrations; 24 cm.
Bibliografia:Includes bibliographical references (p. 199-214) and index.
ISBN:0890069077

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