High-level test synthesis of digital VLSI circuits /

High-level test synthesis of digital VLSI circuits /

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Detalles Bibliográficos
Autor Principal: Lee, Mike Tien - Chien (Author)
Formato: Libro
Idioma:English
Publicado: Boston Artech House c1997
Series:The Artech House solid-state technology library
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Testing > Data processing.
Computer-aided design.
Digital integrated circuits > Testing > Data processing.
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Descripción
Descrición Física:xi, 220 pages: illustrations; 24 cm.
Bibliografía:Includes bibliographical references (p. 199-214) and index.
ISBN:0890069077

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