APA (7th ed.) Citation

Chim, W. K. (2000). Semiconductor device and failure analysis: Using photon emission microscopy. John Wiley & Sons.

Chicago Style (17th ed.) Citation

Chim, Wai Kin. Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy. West Sussex: John Wiley & Sons, 2000.

MLA (8th ed.) Citation

Chim, Wai Kin. Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy. John Wiley & Sons, 2000.